Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits



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Éditeur :

Kluwer Academic Publishers


Paru le : 2000



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Description

Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means 'meeting the user's needs at a minimum cost'. The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.
Pages
n.c
Collection
n.c
Parution
2000
Marque
Kluwer Academic Publishers
EAN papier
0306470403
EAN PDF
0306470403

Informations sur l'ebook
Nombre pages copiables
1
Nombre pages imprimables
10
Taille du fichier
1445 Ko
Prix
203,87 €

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