Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

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Éditeur :

Academic Press


Paru le : 2010-03-10



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Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading international scholars and industry experts - Discusses hot topic areas and presents current and future research trends - Invaluable reference and guide for physicists, engineers and mathematicians
Pages
304 pages
Collection
n.c
Parution
2010-03-10
Marque
Academic Press
EAN papier
9780123813183
EAN EPUB SANS DRM
9780123813190

Prix
189,90 €

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