Téléchargez le livre : Nanolithography and Surface Microscopy with Electron Beams

Nanolithography and Surface Microscopy with Electron Beams



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Academic Press


Paru le : 2024-10-25



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Description
Nanolithography and Surface Microscopy with Electron Beams, Volume 231 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series
Pages
232 pages
Collection
n.c
Parution
2024-10-25
Marque
Academic Press
EAN papier
9780443314629
EAN EPUB SANS DRM
9780443314636
Informations sur l'ebook
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Prix
184,63 €

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