Trace-Based Post-Silicon Validation for VLSI Circuits

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Éditeur :

Springer


Collection :

Lecture Notes in Electrical Engineering

Paru le : 2013-06-12

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Description
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.  A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
Pages
108 pages
Collection
Lecture Notes in Electrical Engineering
Parution
2013-06-12
Marque
Springer
EAN papier
9783319005324
EAN EPUB
9783319005331

Informations sur l'ebook
Nombre pages copiables
1
Nombre pages imprimables
10
Taille du fichier
1751 Ko
Prix
91,88 €